Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Creating a pervasive testing environment by using SMS messaging
Tretiakov, A.   Kinshuk  
Dept. of Inf. Syst., Massey Univ., Palmerston North, New Zealand;

This paper appears in: Wireless and Mobile Technologies in Education, 2005. WMTE 2005. IEEE International Workshop on
Publication Date: 28-30 Nov. 2005
On page(s): 62- 66
ISBN: 0-7695-2385-4
INSPEC Accession Number: 9052808
Digital Object Identifier: 10.1109/WMTE.2005.13
Current Version Published: 2006-01-23

Abstract
We consider the requirements for a generic m-Learning system that would maximize the likelihood of its acceptance, and conclude that such a system should rely on the existing infrastructure and mobile device ownership, with SMS technology being the most appropriate technology under present conditions. We back this conclusion by conducting a survey on m-Learning acceptance targeted at educators, and demonstrate the feasibility and gauge acceptance by the learners by developing a system prototype and evaluating it in a simulated classroom environment. The results reported in this article speak in favor of introducing low cost, low maintenance SMS based m-Learning systems targeting average, budget conscious educational institutions.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (160 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved