Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Utilization based duty cycle tuning MAC protocol for wireless sensor networks
Shih-Hsien Yang   Hung-Wei Tseng   Wu, E.H.-K.   Gen-Huey Chen  
Dept. of Comput. Sci. & Inf. Eng., Nat. Taiwan Univ., Taipei;

This paper appears in: Global Telecommunications Conference, 2005. GLOBECOM '05. IEEE
Publication Date: 2-2 Dec. 2005
Volume: 6,  On page(s): 5 pp.-3262
Location: St. Louis, MO,
ISBN: 0-7803-9414-3
INSPEC Accession Number: 8956176
Digital Object Identifier: 10.1109/GLOCOM.2005.1578377
Current Version Published: 2006-01-23

Abstract
In this paper, we propose U-MAC, a medium access control protocol designed for wireless sensor networks. Nowadays, wireless sensor network are formed by a great quantity of sensor nodes, which are generally battery-powered and may not recharge easily. Consequently, how to prolong the lifetime of the nodes is an important issue while designing a MAC protocol. However, lowering the energy consumption may result in higher latency. Addressing on such tradeoff, U-MAC balances the tradeoff by utilization based tuning of duty cycle and selective sleeping after transmission. The experiment results show that our proposed U-MAC saves energy about 43% and reduce latency by 65% from S-MAC in a chain topology. In the cross topology, U-MAC also achieves 32% energy saving and 45% latency reduction from S-MAC

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (449 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved