Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Statistical Learning of Visual Feature Hierarchies
Scalzo, F.   Piater, J.H.  
Montefiore Institute University of Liege;

This paper appears in: Computer Vision and Pattern Recognition - Workshops, 2005. CVPR Workshops. IEEE Computer Society Conference on
Publication Date: 25-25 June 2005
On page(s): 44-44
Location: San Diego, CA, USA,
ISSN: 1063-6919
ISBN: 0-7695-2372-2
Digital Object Identifier: 10.1109/CVPR.2005.532
Current Version Published: 2006-01-03

Abstract
We propose an unsupervised, probabilistic method for learning visual feature hierarchies. Starting from local, low-level features computed at interest point locations, the method combines these primitives into high-level abstractions. Our appearance-based learning method uses local statistical analysis between features and Expectation- Maximization (EM) to identify and code spatial correlations. Spatial correlation is asserted when two features tend to occur at the same relative position of each other. This learning scheme results in a graphical model that allows a probabilistic representation of a flexible visual feature hierarchy. For feature detection, evidence is propagated using Nonparametric Belief Propagation (NBP), a recent generalization of particle filtering. In experiments, the proposed approach demonstrates efficient learning and robust detection of object models in the presence of clutter and occlusion and under view point changes.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1140 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved