Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

IEEE 802.11n: enhancements for higher throughput in wireless LANs
Yang Xiao  
Memphis Univ., TN, USA;

This paper appears in: Wireless Communications, IEEE
Publication Date: Dec. 2005
Volume: 12,  Issue: 6
On page(s): 82- 91
ISSN: 1536-1284
INSPEC Accession Number: 8712607
Digital Object Identifier: 10.1109/MWC.2005.1561948
Current Version Published: 2005-12-19

Abstract
This article introduces a new standardization effort, IEEE 802.11n, an amendment to IEEE 802.11 standards that is capable of much higher throughputs, with a maximum throughput of at least 100 Mb/s, as measured at the medium access control data services access point. The IEEE 802.11n will provide both physical layer and MAC enhancements. In this article we introduce some PHY proposals and study the fundamental issue of MAC inefficiency. We propose several MAC enhancements via various frame aggregation mechanisms that overcome the theoretical throughput limit and reach higher throughput. We classify frame aggregation mechanisms into many different and orthogonal aspects, such as distributed vs. centrally controlled, ad hoc vs. infrastructure, uplink vs. downlink, single-destination vs. multi-destination, PHY-level vs. MAC-level, single-rate vs. multirate, immediate ACK vs. delayed ACK, and no spacing vs. SIFS spacing.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (394 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved