Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Blind Source Separation and Sparse Bump Modelling of Time Frequency Representation of Eeg Signals: New Tools for Early Detection of Alzheimer’s Disease
Vialatte, F.   Cichocki, A.   Dreyfus, G.   Musha, T.   Rutkowski, T.M.   Gervais, R.  
Lab. d'Electronique, ParisTech, Paris;

This paper appears in: Machine Learning for Signal Processing, 2005 IEEE Workshop on
Publication Date: 28-28 Sept. 2005
On page(s): 27-32
Location: Mystic, CT,
ISBN: 0-7803-9517-4
INSPEC Accession Number: 8734056
Digital Object Identifier: 10.1109/MLSP.2005.1532869
Current Version Published: 2005-11-21

Abstract
The early detection of Alzheimer's disease (AD) is an important challenge. In this paper, we propose a novel method for early detection of AD using only electroencephalographic (EEG) recordings for patients with mild cognitive impairment (MCI) without any clinical symptoms of the disease who later developed AD. In our method, first a blind source separation algorithm is applied to extract the most significant spatiotemporal uncorrelated components; afterward these components are wavelet transformed; subsequently the wavelets or more generally time frequency representation (TFR) is approximated with sparse bump modeling approach. Finally, reliable and discriminant features are selected and reduced with orthogonal forward regression and the random probe methods. The proposed features were finally fed to a simple neural network classifier. The presented method leads to a substantially improved performance (93% correctly classified - improved sensitivity and specificity) over classification results previously published on the same set of data. We hope that the new computational and machine learning tools provide some new insights in a wide range of clinical settings, both diagnostic and predictive

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (260 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved