Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Clocking and circuit design for a parallel I/O on a first-generation CELL processor
Ken Chang   Pamarti, S.   Kaviani, K.   Alon, E.   Xudong Shi   Chin, T.J.   Jie Shen   Yip, G.   Madden, C.   Schmitt, R.   Yuan, C.   Assaderaghi, F.   Horowitz, M.  
Rambus, Los Altos, CA, USA;

This paper appears in: Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International
Publication Date: 10-10 Feb. 2005
On page(s): 526-615 Vol. 1
Location: San Francisco, CA,
ISSN: 0193-6530
ISBN: 0-7803-8904-2
INSPEC Accession Number: 8652799
Digital Object Identifier: 10.1109/ISSCC.2005.1494101
Current Version Published: 2005-08-29

Abstract
A parallel I/O is integrated on a first-generation CELL processor in 90nm SOI CMOS. A clock-tracking architecture suppresses reference jitter to achieve 6.4Gbit/s/link operation at 21.6mW/Gbit/s. SOI effects on analog circuits, in particular high-speed receivers, are addressed to achieve a receiver sensitivity of ±12mV at 6.4Gbit/s with BER <10-14 measured using 7b PRBS data.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (768 KB)
Multimedia
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved