Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Reducing the complexity of application deployment in large data centers
Eilam, T.   Kalantar, M.H.   Konstantinou, A.V.   Pacifici, G.  
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA;

This paper appears in: Integrated Network Management, 2005. IM 2005. 2005 9th IFIP/IEEE International Symposium on
Publication Date: 15-19 May 2005
On page(s): 221- 234
ISSN:
ISBN: 0-7803-9087-3
INSPEC Accession Number: 8604964
Digital Object Identifier: 10.1109/INM.2005.1440790
Current Version Published: 2005-06-13

Abstract
The deployment and configuration of distributed applications is a human intensive and highly complex process that poses significant challenges to data center operators. The process involves many cross-cutting concerns such as connectivity, performance, and security requirements, as well as resource availability, policies and best practices. These interdependencies represent a significant source of complexity, cost, and risk in data center management. In this paper we address this problem using a new approach that leverages concepts from the model-driven architecture research domain. We describe a prototype application deployment automation system based on model transformation techniques. We show how model transformation techniques can replace the manual process of writing and adapting scripts and workflows, reduce the deployment complexity, guarantee configuration integrity and consistency, and allow for a separation of concerns.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (366 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved