Circuits and techniques for high-resolution measurement of on-chip power supply noise
Alon, E.
Stojanovic, V.
Horowitz, M.A.
Dept. of Electr. Eng., Stanford Univ., CA, USA;
This paper appears in: Solid-State Circuits, IEEE Journal of
Publication Date: April 2005
Volume: 40,
Issue: 4
On page(s): 820- 828
ISSN: 0018-9200
INSPEC Accession Number: 8387227
Digital Object Identifier: 10.1109/JSSC.2004.842853
Current Version Published: 2005-04-25
Abstract
This paper presents a technique for characterizing the statistical properties and spectrum of power supply noise using only two on-chip low-throughput samplers. The samplers utilize a voltage-controlled oscillator to perform high-resolution analog-to-digital conversion with minimal hardware. The measurement system is implemented in a 0.13-μm process along with a high-speed link transceiver. Measured results from this chip validate the accuracy of the measurement system and elucidate several aspects of power supply noise, including its cyclostationary nature.
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