Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Time-between-events charts for on-line process monitoring
Liu, J.Y.   Xie, M.   Goh, T.N.   Ranjan, P.  
Dept. of Industrial & Syst. Eng., National Univ. of Singapore, Singapore;

This paper appears in: Engineering Management Conference, 2004. Proceedings. 2004 IEEE International
Publication Date: 18-21 Oct. 2004
Volume: 3,  On page(s): 1061- 1065 Vol.3
ISBN: 0-7803-8519-5
INSPEC Accession Number: 8331246
Digital Object Identifier: 10.1109/IEMC.2004.1408854
Current Version Published: 2005-04-04

Abstract
With the development of automation and high-quality manufacturing techniques, on-line process monitoring system has become essential for enterprises to ensure product quality and reduce cost. This paper presents an on-line process monitoring system, which provides the users with different charting methods to monitor time-between-events data, and detect process shifts. Some advanced time-between-events control charts, such as cumulative quantity control (CQC) chart, CQC-r chart, exponential EWMA and exponential CUSUM chart are discussed. Comparisons of their performance are carried out based on average time to signal (ATS). The design of an on-line SPC system is described, followed by an application example. The approaches presented in this paper complement other on-line systems and can be integrated into existing systems easily.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (670 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved