Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Efficient low-threshold lasers based on an erbium-doped holey fiber
K. Furusawa   T. Kogure   J.K. Sahu   J.H. Lee   T.M. Monro   D.J. Richardson  
Optoelectronics Res. Centre, Univ. of Southampton, Highfield, UK;

This paper appears in: Photonics Technology Letters, IEEE
Publication Date: Jan. 2005
Volume: 17,  Issue: 1
On page(s): 25-27
ISSN: 1041-1135
INSPEC Accession Number: 8240677
Digital Object Identifier: 10.1109/LPT.2004.837260
Current Version Published: 2004-12-27

Abstract
We report experimental results on the continuous-wave lasers based on a small core erbium-doped holey fiber. In a simple Fabry-Perot-type cavity with high output coupling, we demonstrate low-threshold (0.55 mw) high slope-efficiency (57.3%) operation confirming both the quality and exceptionally high gain efficiency of the fiber. In an all-fiber ring cavity where the cavity loss is reduced, we show that it is possible to achieve a low-threshold laser with extremely wide tunability (>100 nm around 1550 nm). Our results illustrate some of the unique opportunities provided by active small core holey fibers.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (226 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved