Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Graph based image matching
Hui Jiang   Chong-Wah Ngo  
Dept. of Comput. Sci., City Univ. of Hong Kong, Kowloon, China;

This paper appears in: Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on
Publication Date: 23-26 Aug. 2004
Volume: 3,  On page(s): 658- 661 Vol.3
ISSN: 1051-4651
ISBN: 0-7695-2128-2
INSPEC Accession Number: 8392971
Digital Object Identifier: 10.1109/ICPR.2004.1334615
Current Version Published: 2004-09-20

Abstract
Given two or more images, we can define different but related problems on pattern matching such as image registration, pattern detection and localization, and common pattern discovery. These problems have different levels of purpose and difficulties, as a result, often associate with different solutions. In this paper, we propose a novel approach to solve these problems under a unified framework based on graph matching. We first split the images into small blocks and represent each block as a node in a bipartite graph. A maximum weighted bipartite graph matching algorithm is then employed in an iterative way to find the best transformation set. Experimental results show that our approach can handle rotation, scaling and translation, as well as distortion and occlusion. Another virtue of our approach is its efficiency.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (416 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved