Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Towards surface regularization via medial axis transitions
Leymarie, F.F.   Kimia, B.B.   Giblin, P.J.  
Div. of Eng., Brown Univ., Providence, RI, USA;

This paper appears in: Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on
Publication Date: 23-26 Aug. 2004
Volume: 3,  On page(s): 123- 126 Vol.3
ISSN: 1051-4651
ISBN: 0-7695-2128-2
INSPEC Accession Number: 8380923
Digital Object Identifier: 10.1109/ICPR.2004.1334484
Current Version Published: 2004-09-20

Abstract
The reconstruction of objects from data in practical applications often leads to surfaces with small perturbations and other artifacts, which make the detection of their ridges and generalized axes difficult. We propose an approach to smoothing small structures while preserving ridges, which is based on the medial axis structure of the surface. The medial axis of the surface is organized as a graph structure and the closeness of the medial axis graph to points of instability (transitions) is used to identify those structures, which are most likely due to perturbations. The removal of these structures is our approach to regularizing both the medial axis and the surface. This paper focuses on a subset of medial transitions arising from protrusions and the method is illustrated for a few synthetic and real images.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1018 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved