Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Learning from student data
Barker, K.   Trafalis, T.   Rhoads, T.R.  
Sch. of Ind. Eng., Oklahoma Univ., Norman, OK;

This paper appears in: Systems and Information Engineering Design Symposium, 2004. Proceedings of the 2004 IEEE
Publication Date: 16-16 April 2004
On page(s): 79-86
Location: Charlottesville, VA,
ISBN: 0-9744559-2-X
INSPEC Accession Number: 8302346
Digital Object Identifier: 10.1109/SIEDS.2004.239819
Current Version Published: 2004-10-04

Abstract
An abundance of information is contained on every college campus. Many academic, demographic, and attitudinal variables are gathered for every student who steps on campus. Despite all this information, colleges still struggle with graduation rates. This is an apt example of an overload of information but a starvation of knowledge. This paper introduces the use of neural networks and support vector machines, both nonlinear discriminant methods, for classifying student graduation behavior from several academic, demographic, and attitudinal variables maintained about students at the University of Oklahoma

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (344 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved