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On the study of anomalous skin effect for GSI interconnections
Sarvari, R. Meindl, J.D.
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA;

This paper appears in: Interconnect Technology Conference, 2003. Proceedings of the IEEE 2003 International
Publication Date: 2-4 June 2003
On page(s): 42- 44
ISSN:
ISBN: 0-7803-7797-4
INSPEC Accession Number: 7891559
Digital Object Identifier: 10.1109/IITC.2003.1219707
Current Version Published: 2003-08-11

Abstract
The change in the resistivity of a thin wire caused by anomalous skin effect (combined surface scattering and skin effect) is studied. The delay of a digital transmission line due to this effect is modeled. The results show that for a wire in the RC region surface scattering has the major effect on the delay whereas for a wire between the RC and RLC regions both surface scattering and skin effect should be considered.

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