Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Generalized cofactoring for logic function evaluation
Yunjian Jiang   Matic, S.   Brayton, R.K.  
Univ. of California, Berkeley, CA, USA;

This paper appears in: Design Automation Conference, 2003. Proceedings
Publication Date: 2-6 June 2003
On page(s): 155- 158
ISBN: 1-58113-688-9
INSPEC Accession Number: 7852965
Current Version Published: 2003-08-11

Abstract
Logic evaluation of a Boolean function or relation is traditionally done by simulating its gate-level implementation, or creating a branching program using its binary decision diagram (BDD) representation, or using a set of look-up tables. We propose a new approach called generalized cofactoring diagrams, which are a generalization of the above methods. Algorithms are given for finding the optimal cofactoring structure for free-ordered BDD's and generalized cube cofactoring under an average path level (APL) cost criterion. Experiments on multi-valued functions show superior results to previously known methods by an average of 30%. The framework has direct applications in logic simulation, software synthesis for embedded control applications, and functional decomposition in logic synthesis.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (511 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved