Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Improved spread spectrum: a new modulation technique for robust watermarking
Malvar, H.S.   Florencio, D.A.F.  
Commun., Collaboration, & Signal Process. Group, Microsoft Res., Redmond, WA, USA;

This paper appears in: Signal Processing, IEEE Transactions on
Publication Date: Apr 2003
Volume: 51,  Issue: 4
On page(s): 898- 905
ISSN: 1053-587X
INSPEC Accession Number: 7560012
Digital Object Identifier: 10.1109/TSP.2003.809385
Current Version Published: 2003-03-26

Abstract
This paper introduces a new watermarking modulation technique, which we call improved spread spectrum (ISS). When compared with traditional spread spectrum (SS), the signal does not act as a noise source, leading to significant gains. In some examples, performance improvements over SS are 20 dB in signal-to-noise ratio (SNR) or ten or more orders of magnitude in the error probability. The proposed method achieves roughly the same noise robustness gain as quantization index modulation (QIM) but without the amplitude scale sensitivity of QIM. Our proposed ISS is as robust in practice as traditional SS.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (491 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved