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Two-dimensional numerical simulation of metal-semiconductor-metal photodetector structures
Debbar, N.  
Coll. of Eng., King Saud Univ., Riyadh, Saudi Arabia;

This paper appears in: Microelectronics, The 14th International Conference on 2002 - ICM
Publication Date: 11-13 Dec. 2002
On page(s): 269- 272
ISSN:
ISBN: 0-7803-7573-4
INSPEC Accession Number: 7936418
Current Version Published: 2003-01-14

Abstract
A two-dimensional simulation program, based on the drift-diffusion model, is developed. The program numerically solves the basic semiconductor equations. The model is applied to simulate the dark current voltage characteristics of a planar metal-semiconductor-metal photodetectors (MSM).

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