Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A combined structural-functional classification of schizophrenia using hippocampal volume plus fMRI activation
Ford, J.   Li Shen   Makedon, F.   Flashman, L.A.   Saykin, A.J.  
Dept. of Comput. Sci., Dartmouth Coll., Hanover, NH, USA;

This paper appears in: [Engineering in Medicine and Biology, 2002. 24th Annual Conference and the Annual Fall Meeting of the Biomedical Engineering Society] EMBS/BMES Conference, 2002. Proceedings of the Second Joint
Publication Date: 2002
Volume: 1,  On page(s): 48- 49 vol.1
ISSN: 1094-687X
ISBN: 0-7803-7612-9
INSPEC Accession Number: 7581991
Digital Object Identifier: 10.1109/IEMBS.2002.1134381
Current Version Published: 2003-01-06

Abstract
Previous work has demonstrated that fMRI activations in individual anatomic regions can be used as a basis for classifying subjects for schizophrenia. Here we demonstrate that this classification, which is approximately 75-83% accurate for the hippocampal formation, can be improved by incorporating hippocampal volume information, which alone classifies at chance levels of accuracy. The best combined classifier is about 87% accurate and uses only right hippocampal activation and volume data. These accuracy figures should be considered approximate due to the limited size of our test dataset (N=23, 15 patients and 8 controls).

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (263 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved