Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Fast recursive filtering with multiple slow processing elements
Hui-Hung Lu   Lee, E.   Messerschmitt, D.  

This paper appears in: Circuits and Systems, IEEE Transactions on
Publication Date: Nov 1985
Volume: 32,  Issue: 11
On page(s): 1119- 1129
ISSN: 0098-4094
Current Version Published: 2003-01-06

Abstract
This paper describes systolic realizations of FIR and IIR digital filters with sample rates much higher than the speed of a single "arithmetic unit" or "processing element." The architecture trades increased throughput for increased latency. For IIR filters, the technique is based on block-state filter descriptions in which the state update matrix is converted to triangular or "quasi-triangular" form via a unitary or orthogonal similarity transformation. The effect of this transformation on the roundoff noise is examined in the Appendix. The latency, complexity, and suitability to VLSI implementations are considered, as well as an attractive application to interpolation and decimation.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1392 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved