Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Low-power CMOS digital design
Chandrakasan, A.P.   Sheng, S.   Brodersen, R.W.  
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA;

This paper appears in: Solid-State Circuits, IEEE Journal of
Publication Date: Apr 1992
Volume: 27,  Issue: 4
On page(s): 473-484
ISSN: 0018-9200
References Cited: 28
CODEN: IJSCBC
INSPEC Accession Number: 4165927
Digital Object Identifier: 10.1109/4.126534
Current Version Published: 2002-08-06

Abstract
Motivated by emerging battery-operated applications that demand intensive computation in portable environments, techniques are investigated which reduce power consumption in CMOS digital circuits while maintaining computational throughput. Techniques for low-power operation are shown which use the lowest possible supply voltage coupled with architectural, logic style, circuit, and technology optimizations. An architecturally based scaling strategy is presented which indicates that the optimum voltage is much lower than that determined by other scaling considerations. This optimum is achieved by trading increased silicon area for reduced power consumption

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1148 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved