Challenges and Solutions for Late- and Post-Silicon Design
Rabaey, J.M.
Malik, S.
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA;
This paper appears in: Design & Test of Computers, IEEE
Publication Date: July-Aug. 2008
Volume: 25,
Issue: 4
On page(s): 296-302
ISSN: 0740-7475
INSPEC Accession Number: 10178037
Digital Object Identifier: 10.1109/MDT.2008.91
Current Version Published: 2008-08-01
Abstract
As technology scaling becomes more difficult, continuing advances in electronic products and their underlying ICs increasingly rely on innovative design solutions. This article outlines some of the complexity, reliability, and productivity challenges and how the Gigascale Systems Research Center is addressing them.
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