Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Flexibility of interconnection structures for field-programmablegate arrays
Rose, J.   Brown, S.  
Dept. of Electr. Eng., Toronto Univ., Ont.;

This paper appears in: Solid-State Circuits, IEEE Journal of
Publication Date: Mar 1991
Volume: 26,  Issue: 3
On page(s): 277-282
Meeting Date: 05/13/1990 - 05/16/1990
Location: Boston, MA, USA
ISSN: 0018-9200
References Cited: 18
CODEN: IJSCBC
INSPEC Accession Number: 3911421
Digital Object Identifier: 10.1109/4.75006
Current Version Published: 2002-08-06

Abstract
The relationship between the routability of a field-programmable gate array (FPGA) and the flexibility of its interconnection structures is examined. The flexibility of an FPGA is determined by the number and distribution of switches used in the interconnection. While good routability can be obtained with a high flexibility, a large number of switches will result in poor performance and logical density because each switch has significant delay and area. The minimum number of switches required to achieve good routability is determined by implementing several industrial circuits in a variety of interconnection architectures. These experiments indicate that high flexibility is essential for the connection block that joins the logic blocks to the routing channel, but a relative low flexibility is sufficient for switch blocks at the junction of horizontal and vertical channels. Furthermore, it is necessary to use only a few more routing tracks than the absolute minimum possible with structures of surprisingly low flexibility

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (476 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved