Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Architecture of field-programmable gate arrays: the effect of logicblock functionality on area efficiency
Rose, J.   Francis, R.J.   Lewis, D.   Chow, P.  
Dept. of Electr. Eng., Toronto Univ., Ont.;

This paper appears in: Solid-State Circuits, IEEE Journal of
Publication Date: Oct 1990
Volume: 25,  Issue: 5
On page(s): 1217-1225
ISSN: 0018-9200
References Cited: 20
CODEN: IJSCBC
INSPEC Accession Number: 3814258
Digital Object Identifier: 10.1109/4.62145
Current Version Published: 2002-08-06

Abstract
The relationship between the functionality of a field-programmable gate array (FPGA) logic block and the area required to implement digital circuits using that logic block is examined. The investigation is done experimentally by implementing a set of industrial circuits as FPGAs using CAD (computer-aided design) tools for technology mapping, placement, and routing. A range of programming technologies (the method of FPGA customization) is explored using a simple model of the interconnection and logic block area. The experiments are based on logic blocks that use lookup tables for implementing combinational logic. Results indicate that the best number of inputs to use (a measure of the block's functionality) is between three and four, and that a D flip-flop should be included in the logic block. The results are largely independent of the programming technology. More generally, it was observed that the area efficiency of a logic block depends not only on its functionality but also on the average number of pins connected per logic block

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (816 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved