Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

The Development of Systems Engineering
Booton, Richard C.   Ramo, Simon  
TRW Electronic Systems Group;

This paper appears in: Aerospace and Electronic Systems, IEEE Transactions on
Publication Date: July 1984
Volume: AES-20,  Issue: 4
On page(s): 306-310
ISSN: 0018-9251
Digital Object Identifier: 10.1109/TAES.1984.4502055
Current Version Published: 2008-04-30

Abstract
Systems engineering is described as the design of the whole as distinguished from the design of the parts. Systems engineers create the architecture of the system, define the criteria for its evaluation, and perform tradeoff studies for optimization of the subsystem characteristics. In addition to their own brains, the principal tool of systems engineers is the computer. Systems engineering has evolved during a long series of major developments, in particular the intercontinental ballistic missile (ICBM) program. The major growth of systems engineering is expected to be in the improvement of its tools and in the enlargement of the range of problems to which it is applied.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1203 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved