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Single Event Effects in Aerospace

Cover Image Copyright Year: 2011
Author(s): Petersen, E.
Publisher: Wiley-IEEE Press
Content Type : Books & eBooks
Topics: Aerospace ;  Communication, Networking & Broadcasting ;  Components, Circuits, Devices & Systems ;  Computing & Processing (Hardware/Software) ;  Fields, Waves & Electromagnetics ;  Signal Processing & Analysis
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Abstract

Enables readers to better understand, calculate, and manage single event effectsSingle event effects, caused by single ionizing particles that penetrate sensitive nodes within an electronic device, can lead to anything from annoying system responses to catastrophic system failures. As electronic components continue to become smaller and smaller due to advances in miniaturization, electronic components designed for avionics are increasingly susceptible to these single event phenomena. With this book in hand, readers learn the core concepts needed to understand, predict, and manage disruptive and potentially damaging single event effects.Setting the foundation, the book begins with a discussion of the radiation environments in space and in the atmosphere. Next, the book draws together and analyzes some thirty years of findings and best practices reported in the literature, exploring such critical topics as:
Design of heavy ion and proton experiments to optimize the data needed for single event predictions
Data qualification and analysis, including multiple bit upset and parametric studies of device sensitivity
Pros and cons of different approaches to heavy ion, proton, and neutron rate predictions
Results of experiments that have tested space predictionsSingle Event Effects in Aerospace is recommended for engineers who design or fabricate parts, subsystems, or systems used in avionics, missile, or satellite applications. It not only provides them with a current understanding of single event effects, it also enables them to predict single event rates in aerospace environments in order to make needed design adjustments.

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      Frontmatter

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.fmatter
      Page(s): i - xiii
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      The prelims comprise:
      Half Title
      IEEE Press Editorial Board
      Title
      Copyright
      Contents View full abstract»

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      Introduction

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch1
      Page(s): 1 - 12
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Background
      Analysis of Single Event Experiments
      Modeling Space and Avionics See Rates
      Overview of this Book
      Scope of this Book View full abstract»

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      Foundations of Single Event Analysis and Prediction

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch2
      Page(s): 13 - 76
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Overview of Single Particle Effects
      Particle Energy Deposition
      Single Event Environments
      Charge Collection and Upset
      Effective Let
      Charge Collection Volume and the Rectangular Parallelepiped (RPP)
      Upset Cross Section Curves
      Critical Charge
      Upset Sensitivity and Feature Size
      Cross-Section Concepts View full abstract»

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      Optimizing Heavy Ion Experiments for Analysis

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch3
      Page(s): 77 - 102
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Sample Heavy Ion Data
      Test Requirements
      Curve Parameters
      Angular Steps
      Stopping Data Accumulation When You Reach the Saturation Cross Section
      Device Shadowing Effects
      Choice of Ions
      Determining the LET in the Device
      Energy Loss Spread
      Data Requirements
      Experimental Statistics and Uncertainties
      Effect of Dual Thresholds
      Fitting Cross-Section Data
      Other Sources of Error and Uncertainties View full abstract»

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      Optimizing Proton Testing

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch4
      Page(s): 103 - 109
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Monitoring the Beam Intensity and Uniformity
      Total Dose Limitations on Testing
      Shape of the Cross-Section Curve View full abstract»

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      Data Qualification and Interpretation

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch5
      Page(s): 111 - 164
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Data Characteristics
      Approaches to Problem Data
      Interpretation of Heavy Ion Experiments
      Possible Problems with Least Square Fitting Using the Weibull Function View full abstract»

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      Analysis of Various Types of SEU Data

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch6
      Page(s): 165 - 250
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Critical Charge
      Depth and Critical Charge
      Charge Collection Mechanisms
      Charge Collection and the Cross-Section Curve
      Efficacy (Variation of SEU Sensitivity within a Cell)
      Mixed-Mode Simulations
      Parametric Studies of Device Sensitivity
      Influence of Ion Species and Energy
      Device Geometry and the Limiting Cross Section
      Track Size Effects
      Cross-Section Curves and the Charge Collection Processes
      Single Event Multiple-Bit Upset
      SEU in Logic Systems
      Transient Pulses View full abstract»

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      Cosmic Ray Single Event Rate Calculations

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch7
      Page(s): 251 - 303
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Introduction to Rate Prediction Methods
      The RPP Approach to Heavy Ion Upset Rates
      The Integral RPP Approach
      Shape of the Cross-Section Curve
      Assumptions Behind the RPP and IRPP Methods
      Effective Flux Approach
      Upper Bound Approaches
      Figure of Merit Upset Rate Equations
      Generalized Figure of Merit
      The FOM and the LOG Normal Distribution
      Monte Carlo Approaches
      PRIVIT
      Integral Flux Method View full abstract»

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      Proton Single Event Rate Calculations

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch8
      Page(s): 305 - 328
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Nuclear Reaction Analysis
      Semiempirical Approaches and the Integral Cross-Section Calculation
      Relationship of Proton and Heavy Ion Upsets
      Correlation of the FOM with Proton Upset Cross Sections
      Upsets Due to Rare High Energy Proton Reactions
      Upset Due to Ionization by Stopping Protons, Helium Ions, and Iron Ions View full abstract»

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      Neutron Induced Upset

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch9
      Page(s): 329 - 336
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Neutron Upsets in Avionics
      Upsets at Ground Level View full abstract»

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      Upsets Produced by Heavy Ion Nuclear Reactions

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch10
      Page(s): 337 - 343
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Heavy Ion Nuclear Reactions
      Upset Rate Calculations for Combined Ionization and Reactions
      Heavy Nuclear Ion Reactions Summary View full abstract»

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      Samples of Heavy Ion Rate Prediction

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch11
      Page(s): 345 - 370
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Low Threshold Studies
      Comparison of Upset Rates for Weibull and Lognormal Functions
      Low Threshold-Medium Lc data
      See Sensitivity and LET Thresholds
      Choosing Area and Depth for Rate Calculations
      Running CREME96 Type Codes
      CREME-MC and SPENVIS
      Effect of Uncertainties in Cross Section on Upset Rates View full abstract»

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      Samples of Proton Rate Predictions

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch12
      Page(s): 371 - 374
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Trapped Protons
      Correlation of the FOM with Proton Upset Rates View full abstract»

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      Combined Environments

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch13
      Page(s): 375 - 387
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Relative Proton and Cosmic Ray Upset Rates
      Calculation of Combined Rates Using the Figure of Merit
      Rate Coefficients for a Particular New Orbit
      Rate Coefficients for Any Circular Orbit About the Earth
      Ratio of Proton to Heavy Ion Upsets for Near Earth Circular Orbits
      Single Events from Ground to Outer Space View full abstract»

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      Samples of Solar Events and Extreme Situations

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch14
      Page(s): 389 - 393
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      No abstract. View full abstract»

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      Upset Rates in Neutral Particle Beam (NPB) Environments

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch15
      Page(s): 395 - 400
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Characteristics of NPB Weapons
      Upsets in the NPB Beam View full abstract»

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      Predictions and Observations of SEU Rates in Space

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch16
      Page(s): 401 - 427
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      Results of Space Observations
      Environmental Uncertainties
      Examination of Outliers
      Possible Reasons for Poor Upset Rate Predictions
      Constituents of a Good Rate Comparison Paper
      Summary and Conclusions
      Recent Comparisons
      Comparisons with Events During Solar Activity View full abstract»

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      Limitations of the IRPP Approach

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.ch17
      Page(s): 429 - 434
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This chapter contains sections titled:
      The IRPP and Deep Devices
      The RPP When Two Hits are Required
      The RPP Approaches Neglect Track Size
      The IRPP Calculates Number of Events, not Total Number of Upsets
      The RPP Approaches Neglect Effects that Arise Outside the Sensitive Volume
      The IRPP Approaches Assume that the Effect of Different Particles with the Same LET is Equivalent
      The IRPP Approaches Assume that the LET of the Particle is not Changing in the Sensitive Volume
      The IRPP Approach Assumes that the Charge Collection Does Not Change with Device Orientation
      The Status of Single Event Rate Analysis View full abstract»

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      Appendix A: Useful Numbers

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.app1
      Page(s): 435 - 436
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      No abstract. View full abstract»

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      Appendix B: Reference Equations

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.app2
      Page(s): 437 - 444
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This appendix contains sections titled:
      Weibull Function
      Lognormal Distribution
      Exponential Distribution
      Least Squares Fitting
      Weighted Least Squares Fitting
      Calculation of Coefficient of Determination R 2
      The Bendel-Petersen Equation for the Proton Cross Section
      The Figure of Merit and Upset Rate Calculations
      RPP Differential and Integral Path Length Distributions View full abstract»

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      Appendix C: Quick Estimates of Upset Rates Using the Figure of Merit

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.app3
      Page(s): 445 - 447
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      No abstract. View full abstract»

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      Appendix D: Part Characteristics

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.app4
      Page(s): 448 - 451
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      No abstract. View full abstract»

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      Appendix E: Sources of Device Data

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.app5
      Page(s): 452 - 453
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      This appendix contains sections titled:
      Nuclear and Space Radiation Effects Conference (NSREC)
      Data Sets View full abstract»

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      References

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.refs
      Page(s): 455 - 487
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      No abstract. View full abstract»

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      Author Index

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.indauth
      Page(s): 489 - 494
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      No abstract. View full abstract»

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      Subject Index

      Petersen, E.
      Single Event Effects in Aerospace

      Digital Object Identifier: 10.1002/9781118084328.indsub
      Page(s): 495 - 502
      Copyright Year: 2011

      Wiley-IEEE Press eBook Chapters

      No abstract. View full abstract»




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