Monte-Carlo analysis of measurement uncertainties for on-wafer thru-reflect-line calibrations

Although on-wafer high-frequency measurements are nowadays commonly used, uncertainties for scattering-parameter measurements in planar transmission lines are still not yet established - a problem which has been long solved in coaxial lines and waveguides. We describe a GUM-compliant approach that is capable of providing a traceability path for on-wafer measurements up to 50 GHz using the TRL calibration algorithm.