Tracing the complex RE reflection coefficient in the MHz range back to DC resistance standards by utilizing planar NiCr thin-film resistors

A method to determine the three error box parameters of complex reflectometers is proposed where a number of planar NiCr thin-film resistors mounted in identical coaxial connectors and traced back to DC resistance standards are used. First experimental results show that this method seems to be applicable to frequencies up to about 500 MHz.<
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