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Macromodeling of digital I/O ports for system EMC assessment

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6 Author(s)
Stievano, I.S. ; Dipt. di Elettronica, Politecnico di Torino, Italy ; Chen, Z. ; Becker, D. ; Canavero, F.G.
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This paper addresses the development of accurate and efficient behavioral models of digital integrated circuit input and output ports for EMC and signal integrity simulations. A practical modeling process is proposed and applied to some example devices. The modeling process is simple and efficient, and it yields models performing at a very high accuracy level

Published in:

Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings

Date of Conference:

2002