By Topic

Incremental diagnosis and correction of multiple faults and errors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Veneris, A. ; Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada ; Liu, J.B. ; Amiri, M. ; Abadir, M.S.

An incremental simulation-based approach to fault diagnosis and logic debugging is presented. During each iteration of the algorithm, a single suspicious location is identified and fault modeled such that the functionality of the new design becomes "closer" to its specification. The method is based on a simple and, at a first glance, counter-intuitive theoretical result along with a number of heuristics which help avoid the exponential complexity inherent to the problems. Experiments on multiple design errors and multiple stuck-at faults confirm its effectiveness and accuracy, which scales well with increasing number of errors

Published in:

Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings

Date of Conference:

2002