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In this paper, we examine thermal noise and radiation-pressure effects in MEMS tunable Fabry-Perot etalons. We show that thermal noise causes a jitter in the center wavelength in very high finesse etalons. In turn, the jitter causes an effective increase in the time-averaged filter bandwidth. Radiation pressure is of little consequence in conventional Fabry-Perot etalons, but it can give rise to nonlinearities and hysteresis in the tuning response of high-finesse MEMS filters. We develop models of noise and optical nonlinearities and compare the models with a series of measurements on commercial tunable high-finesse MEMS Fabry-Perot etalons
Published in:
Selected Topics in Quantum Electronics, IEEE Journal of
(Volume:8
,
Issue:
1
)
Date of Publication: Jan/Feb 2002
- Page(s):
- 88 - 97
- ISSN :
- 1077-260X
- INSPEC Accession Number:
- 7240200
- Digital Object Identifier :
- 10.1109/2944.991403
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 07 August 2002
- Issue Date :
- Jan/Feb 2002
- Sponsored by :
- IEEE Photonics Society
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