Cart (Loading....) | Create Account
Close category search window
 

A tailored capability model for inspection process improvement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Tervonen, I. ; Dept. of Inf. Process. Sci., Oulu Univ., Finland ; Iisakka, J. ; Harjumaa, L.

Software inspection is recognised as the most effective means of finding defects. In spite of its important role in software development, existing capability models have not addressed inspection issues or looked for inspection-related improvement activities to a sufficient extent. The inspection-tailored capability model presented provides a method for evaluating inspection process capability and supports the location of weak points in a company's inspection process. The first experiments reported are promising, and the evaluation process discovered correctly focused improvement ideas which were also agreed on by the company concerned

Published in:

Quality Software, 2001. Proceedings.Second Asia-Pacific Conference on

Date of Conference:

2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.