By Topic

Fast 5 ns pulse width measurement in a high-speed signal integrity test system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Nastase, A.S. ; Newport Corp., Irvine, CA, USA ; Nelson, R.L.

This paper presents a measurement method that can evaluate the pulse width and shape, as low as 5 ns, in high speed signals. It is very useful in signal integrity test systems, where the test speed and accuracy are at premium. This method is an elegant alternative to the DSP techniques

Published in:

Semiconductor Conference, 2001. CAS 2001 Proceedings. International  (Volume:2 )

Date of Conference:

Oct 2001