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Measuring mixed-signal substrate coupling

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4 Author(s)
Rolain, Y. ; Dept. of Electr. Meas., Vrije Univ., Brussels, Belgium ; Van Moer, W. ; Vandersteen, Gerd ; van Heijningen, M.

A measurement method is proposed to characterize the substrate coupling between digital and analog sections of a mixed-signal CMOS chip. Induced noise and spurious signals can be measured by a custom-designed analog sensor. This paper proposes a method that, when given such a sensor, allows to measure the crosstalk between digital and analog chip sections. Calibrated sampling scope measurements illustrate the performance of the measurement setup

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:50 ,  Issue: 4 )

Date of Publication:

Aug 2001

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