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Built-in self-test for signal integrity

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2 Author(s)
Nourani, M. ; Center for Integrated Circuits & Syst., Texas Univ., Dallas, TX, USA ; Attarha, A.

Unacceptable loss of signal integrity may harm the functionality of SoCs permanently or intermittently. We propose a systematic approach to model and test signal integrity in deep-submicron highspeed interconnects. Various signal integrity problems occurring on such interconnects (e.g. crosstalk, overshoot, noise, skew, etc.) are considered in a unified model. We also present a test methodology that uses a noise detection circuitry to detect low integrity signals and an inexpensive test architecture to measure and read the statistics for final observation and analysis.

Published in:

Design Automation Conference, 2001. Proceedings

Date of Conference:

2001