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A bit-line GND sense technique for low-voltage operation FeRAM

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7 Author(s)
Kawashima, S. ; Fujitsu Labs. Ltd., Atsugi, Japan ; Endo, T. ; Yamamoto, T. ; Nakabayashi, K.I.
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We propose a sense scheme in which a pMOS charge-transfer maintains the bit-line level near the GND level when the plate line goes high. The scheme supplies 0.5 V higher read-out voltages across the cell capacitors and achieves a 0.4 V higher differential amplitude in a 512-cell per bit-line structure than a conventional DRAM sense scheme. A shifted bias plate line layout enables a minimum number of bit-lines to be activated and achieves 8.06 mW at 3 V, 5 MHz, about same power as a conventional device.

Published in:

VLSI Circuits, 2001. Digest of Technical Papers. 2001 Symposium on

Date of Conference:

14-16 June 2001