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A finite element method (FEM) analysis of a shielded velocity-matched Ti:LiNbO/sub 3/ optical modulator

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4 Author(s)
K. Kawano ; NTT Opto-Electron. Lab., Kanagawa, Japan ; K. Noguchi ; T. Kitoh ; H. Miyazawa

Shielded velocity-matched Ti:LiNbO/sub 3/ Mach-Zehnder optical modulators are analyzed based on the second-order triangular-element quasi-transverse-electromagnetic finite element method. The relationship between the traveling-wave electrode thickness and the optimum overlaid layer thickness is numerically investigated. The modulation bandwidth of the shielded velocity-matched optical modulator is greatly improved by incorporating the traveling-wave electrode thickness into the design of the optimum overlaid layer thickness in the 1.5 mu m wavelength region.<>

Published in:

IEEE Photonics Technology Letters  (Volume:3 ,  Issue: 10 )