By Topic

Update on optical component reliability and testing requirements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Kapron, F.P. ; Stand. Eng., Corning Inc., NY, USA

Optical component reliability, as underway in international standards, is reviewed. In optical communications, the reliability functions of fiber and optoelectronic semiconductor transceivers, has been extensively studied and modeled for some time. The mechanisms causing failure for these are relatively well known. The mechanisms in other items such as passive optical components, optical amplifiers, or dynamic components (that are optically passive but electrically active) are not nearly as well understood.

Published in:

Optical Fiber Communication Conference and Exhibit, 2001. OFC 2001  (Volume:4 )

Date of Conference:

17-22 March 2001