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Browse Conference Publications > Microwave Conference, 2000 As ... Help

Frequency dependence of measurement precision in two dielectric resonator method for estimating surface resistance of high-Tc superconductor films

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3 Author(s)
Kobayashi, Y. ; Dept. of Electr. & Electron. Syst., Saitama Univ., Urawa, Japan ; Yoshikawa, Hiromichi ; Hashimoto, Toru

A two dielectric resonator method using two sapphire-rod resonators has been proposed as the most promising method to measure surface resistance Rs of high-Tc superconductor films precisely. In this paper, the frequency dependence of the Rs measurement precision is estimated analytically, taking account of the frequency dependences of tanδ of sapphire and Rs of YBCO films in the frequency range from 10 to 50 GHz. The temperature dependence of Rs for YBCO films was measured at 20 GHz. The measurement precision of Rs=0.16 mΩ at 20 K was estimated to be 5 percents

Published in:
Microwave Conference, 2000 Asia-Pacific

Date of Conference: 2000

Page(s):
1564 - 1567
Meeting Date :
03 Dec 2000-06 Dec 2000
Print ISBN:
0-7803-6435-X
INSPEC Accession Number:
6949779
Conference Location :
Sydney, NSW
Digital Object Identifier :
10.1109/APMC.2000.926138
Product Type:
Conference Publications

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