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Capacity analysis tool

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3 Author(s)
Sisler, S. ; Microelectron. Div., IBM Corp., Essex Junction, VT, USA ; Merrill, E. ; Sorrentino, P.

This paper describes a capacity analysis tool developed to quickly screen potential wafer profiles for a multi-technology, multi-part number, IBM Microelectronics semiconductor fabricator. This tool identifies constraints and opportunities within the fabricator, as well as capacity shortages of key tool sets for a given wafer load. Quicker capacity analysis was demanded not only by a more dynamic market, but also by new strategies to exclusively manufacture logic and pursue OEM market opportunities

Published in:

Advanced Semiconductor Manufacturing Conference, 2001 IEEE/SEMI

Date of Conference: