Cart (Loading....) | Create Account
Close category search window
 

A variable partition approach for disjoint decomposition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Muthukumar Venkatesan ; Dept. of Electr. & Comput., Univ. of Las Vegas, NV, USA ; Bighall, R. ; Selvaraj, H.

This paper deals with the problem of determining the set of best free and bound variables (variable partitioning problem) for disjoint serial decomposition, such that the decomposed functions are smaller in size and have maximal don't cares. A pruned breadth first search (PBFS) approach is proposed to determine the set of good variable partitions with minimal time and computational complexity. The set of best variable partitions are selected from the set of good variable partitions by (1) determining the number of block partitions in the output partition of the predecessor function, and (2) heuristic evaluation of the number of don't cares that may be introduced during the encoding of the decomposed functions. The proposed approach has been successfully implemented and tested with MCNC and Espresso benchmarks

Published in:

Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on  (Volume:5 )

Date of Conference:

2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.