Cart (Loading....) | Create Account
Close category search window
 

Determination of magnetic properties using a room-temperature scanning SQUID microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Fleet, E.F. ; Dept. of Phys., Maryland Univ., College Park, MD, USA ; Chatraphorn, S. ; Wellstood, F.C. ; Eylem, C.

We have used a YBCO de SQUID at 77 K to image room-temperature magnetic thin film samples. Samples imaged include Fe3O4 , rare earth magnets such as samarium cobalt, and CMR materials. We typically saturate the magnetization of the sample in fields up to 8.5 Tesla, and then image the remanent (zero applied field) state. To help quickly interpret and quantify the SQUID microscope data, we have developed several analytical techniques. These techniques yield quantifiable results of magnetic properties, including magnetization, total dipole moment, and the demagnetizing field. We will present our results and discuss applications and limits of SQUID microscopy to the characterization of bulk and thin-film magnetic materials

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:11 ,  Issue: 1 )

Date of Publication:

Mar 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.