Cart (Loading....) | Create Account
Close category search window
 

An efficient parallel transparent BIST method for multiple embedded memory buffers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Huang, D.C. ; Dept. of Comput. Sci., Nat. Chung-Cheng Univ., Taiwan ; Jone, W.B. ; Das, S.R.

In this paper, we propose a new transparent built-in self-test (TBIST) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent test interface is designed to perform testing in the normal mode and to cope with nested interrupts in a realtime manner. The circular scan test interface facilitates the processes of both test pattern generation and signature analysis. By tolerating redundant read/write/shift operations, we develop a new march algorithm called TRSMarch to achieve the goals of low hardware overhead, short test time, and high fault coverage

Published in:

VLSI Design, 2001. Fourteenth International Conference on

Date of Conference:

2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.