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Universal test generation using fault tuples

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3 Author(s)
Desineni, R. ; Center for Electron. Design Autom., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Dwarkanath, K.N. ; Blanton, R.D.

A test generation tool for combinational circuits called FATGEN has been developed based on the notion of fault tuples. FATGEN can be used to simultaneously generate tests for many types of misbehavior that occur in digital systems. Individual experiments involving SSL, transistor stuck-open, path delay and bridging faults for the ISCAS85 benchmark circuits reveal an average speedup of nearly 32% and test set compaction of 60% when faults of all types are analyzed simultaneously. In addition, there is an average reduction of approximately 34% in the number of aborted faults

Published in:

Test Conference, 2000. Proceedings. International

Date of Conference:

2000