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The path to one-picosecond accuracy

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2 Author(s)
Sartori, L. ; Schlumberger Semicond. Solutions, San Jose, CA, USA ; West, B.G.

Since 1990, architectural innovations and implementation breakthroughs have driven EPA from ±250 ps to ±50 ps, in a tester with the same waveform capabilities and the same cost per pin. Further progress, called for by new devices all over the application spectrum, is based on tight control of the ATE timing error budget, and addresses the fundamental challenge of source synchronous timing. The path to deep picosecond accuracy is driven by calibration technology

Published in:

Test Conference, 2000. Proceedings. International

Date of Conference:

2000

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