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On invalidation mechanisms for non-robust delay tests

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1 Author(s)

In most of the delay fault testing literature there is a widespread belief that a non-robust test for a path delay fault can be invalidated only through the existence of another path delay fault. In this paper the author presents an analysis of conditions that can invalidate a non-robust test, and gives four different invalidation mechanisms. Three of these mechanisms, in addition to pulse dampening, do not require the existence of another path delay fault in a circuit. He also defines pseudo-VNR tests, and shows that this is the most common interpretation of validatable-non-robust tests in the literature. Uncovering the invalidation mechanisms for non-robust tests is quite important given the fact that a large number of paths in a circuit usually do not have any robust tests

Published in:

Test Conference, 2000. Proceedings. International

Date of Conference:

2000

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