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Enhanced delay defect coverage with path-segments

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2 Author(s)
Sharma, M. ; Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA ; Patel, J.H.

The number of robustly testable paths is very low for typical circuits, hence the delay defect coverage of a robust path fault test set can be very small. Robustly testing path-segments which are not covered by any robustly testable paths can enhance the defect coverage of a path test set, however the existence of such uncovered path-segments in benchmark circuits has not been proven so far. In this paper we experimentally prove the existence of robustly testable path-segments not covered by any robustly testable paths in the ISCAS benchmark circuits. A highly effective delay fault test generator using some novel techniques, has been implemented for this purpose and is also described in the paper

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Test Conference, 2000. Proceedings. International

Date of Conference: