Cart (Loading....) | Create Account
Close category search window
 

An improved fault diagnosis algorithm based on path tracing with dynamic circuit extraction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Shigeta, K. ; Analysis Technol. Dev. Div., NEC Corp., Kawasaki, Japan ; Ishiyama, T.

We have proposed a fault diagnosis algorithm based on path tracing which dynamically extracts partial circuits and traces error propagation paths from failing primary outputs to a fault origin. Logic inference and the rating procedures are improved, so that various fault modes such as stuck-at, open and bridge faults can be diagnosed. We have shown that the improved technique localizes faults effectively in a reasonable time by applying it to several scan-based circuits: 20 K-gate benchmark circuits (ISCAS'89), and 100 K- and 2M-gate industrial circuits

Published in:

Test Conference, 2000. Proceedings. International

Date of Conference:

2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.