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An improved fault diagnosis algorithm based on path tracing with dynamic circuit extraction

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2 Author(s)
Shigeta, K. ; Analysis Technol. Dev. Div., NEC Corp., Kawasaki, Japan ; Ishiyama, T.

We have proposed a fault diagnosis algorithm based on path tracing which dynamically extracts partial circuits and traces error propagation paths from failing primary outputs to a fault origin. Logic inference and the rating procedures are improved, so that various fault modes such as stuck-at, open and bridge faults can be diagnosed. We have shown that the improved technique localizes faults effectively in a reasonable time by applying it to several scan-based circuits: 20 K-gate benchmark circuits (ISCAS'89), and 100 K- and 2M-gate industrial circuits

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Test Conference, 2000. Proceedings. International

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