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Discussion of "Two new methods for very fast fault type detection by means of parameter fitting and artificial neural networks" [Closure to discussion]

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2 Author(s)
Funabashi, T. ; Meidensha Corp., Tokyo, Japan ; Frohlich, K.

The author discusses the original paper ("Two new methods for very fast fault type detection by means of parameter fitting and artificial neural networks", A. Poetl et al., see ibid., vol. 14, no. 4, p. 1269-75, 1999) and presents his observations. The original authors' response to the discussion is also included.

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Power Delivery, IEEE Transactions on  (Volume:15 ,  Issue: 4 )