By Topic

Statistical characterization of multiconductor transmission lines illuminated by a random plane-wave field

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Pignari, S. ; Dipt. di Elettrotecnica, Politecnico di Milano, Italy ; Bellan, D.

This work addresses the problem of field coupling to multiconductor transmission lines (MTLs) by means of a statistical approach. Currents induced in the MTL loads are regarded as random variables, depending on random amplitude, polarization, and direction of incidence of an offending plane wave. The aim is to identify some statistical properties of the current magnitude in the line loads. Influences of the MTL geometrical parameters and load configurations on the statistical properties of the currents induced in different MTL wires are investigated. In particular, a bundle- and a bus-like configuration are analyzed and compared from the point of view of external susceptibility. For low frequencies, the consistency of statistical estimates is supported by analytical considerations

Published in:

Electromagnetic Compatibility, 2000. IEEE International Symposium on  (Volume:2 )

Date of Conference: