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CA-CSTP: a new BIST architecture for sequential circuits

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4 Author(s)
F. Corno ; Dipt. di Autom. e Inf., Politecnico di Torino, Italy ; M. Sonza Reorda ; G. Squillero ; M. Violante

Circular Self-Test Path (CSTP) is an attractive technique for implementing BIST in sequential circuits; unfortunately, there are cases in which the fault coverage it attains is unacceptably low. This paper proposes a new architecture, named CA-CSTP, which overcomes these limitations and always reaches a high fault coverage by exploiting a slightly more complex chain cell based on a Cellular Automata architecture. Experimental results show the effectiveness of our proposal

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Test Workshop, 2000. Proceedings. IEEE European

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